| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| 4711-1,0.pdf | 4711-1,0.pdf | 20/07/21 | A G R E A T E R M E A S U | 1129 kB | 2 | Keithley | 4711-1,0 |
| Katalog 2011 2012.pdf | Katalog 2011 2012.pdf | 16/03/20 | Test & Measurement
Catalog 2011/12
| 45379 kB | 2 | HP | Katalog 2011 2012 |
| 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 15/09/21 | Keysight Technologies
Solutions for Meas | 718 kB | 4 | Agilent | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers |
| LeCroy_1996_Catalog_(Reduced_Size).pdf | LeCroy_1996_Catalog_(Reduced_Size).pdf | 02/02/20 | LeCroy 1996
Test & Measurement P | 42417 kB | 8 | LeCroy | LeCroy 1996 Catalog (Reduced Size) |
| 5980-2862EN.pdf | 5980-2862EN.pdf | 22/03/20 | Agilent
Solutions for Measuring
Permitti | 1536 kB | 3 | HP | 5980-2862EN |
| MW catalog 2.pdf | MW catalog 2.pdf | 15/01/20 | Agilent RF and
Microwave
Test Accessorie | 6383 kB | 2 | HP | MW catalog 2 |
| 5952-1430E LCR Meters_252C Impedance Analyzers and Test Fixtures Selection Guide c20141028 [15].pdf | 5952-1430E LCR Meters_252C Impedance Analyzers and Test Fixtures Selection Guide c20141028 [15].pdf | 29/06/21 | Keysight Technologies
LCR Meters, Impeda | 720 kB | 8 | Agilent | 5952-1430E LCR Meters 252C Impedance Analyzers and Test Fixtures Selection Guide c20141028 [15] |
|
| E5500 Series Phase Noise Measurement Solutions - Configuration Guide 5988-9891EN c20140616 [6].pdf | E5500 Series Phase Noise Measurement Solutions - Configuration Guide 5988-9891EN c20140616 [6].pdf | 09/08/21 | Keysight Technologies
E5500 Series
Phase | 557 kB | 1 | Agilent | E5500 Series Phase Noise Measurement Solutions - Configuration Guide 5988-9891EN c20140616 [6] |
| 375-2,0.pdf | 375-2,0.pdf | 30/07/21 | | 609 kB | 5 | Keithley | 375-2,0 |
| Lightwave Catalog_ General Photonic Test 2014 Volume 1 - Catalog 5989-6753EN c20140324 [40].pdf | Lightwave Catalog_ General Photonic Test 2014 Volume 1 - Catalog 5989-6753EN c20140324 [40].pdf | 15/07/21 | LIGHTWAVE CATALOG
General Photonic Te | 1489 kB | 1 | Agilent | Lightwave Catalog General Photonic Test 2014 Volume 1 - Catalog 5989-6753EN c20140324 [40] |
| 5990-7367EN PXI and AXIe Modular Products Catalog September 2013 c20130920 [124].pdf | 5990-7367EN PXI and AXIe Modular Products Catalog September 2013 c20130920 [124].pdf | 29/08/20 | Agilent C | 5403 kB | 1 | Agilent | 5990-7367EN PXI and AXIe Modular Products Catalog September 2013 c20130920 [124] |
| 5990-8911EN Find the right switching solutions for your test and measurement needs c20140827 [7].pdf | 5990-8911EN Find the right switching solutions for your test and measurement needs c20140827 [7].pdf | 08/07/21 | Keysight Technologies
Find the Right Swi | 357 kB | 1 | Agilent | 5990-8911EN Find the right switching solutions for your test and measurement needs c20140827 [7] |
| 5989-7177EN Keysight and Academia Partners in Education and Innovation - Promotional Flyer c20140725 | 5989-7177EN Keysight and Academia Partners in Education and Innovation - Promotional Flyer c20140725 | 02/06/21 | Keysight Technologies and Academia
Partn | 125 kB | 1 | Agilent | 5989-7177EN Keysight and Academia Partners in Education and Innovation - Promotional Flyer c20140725 |
| Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA 5991-0332 | Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA 5991-0332 | 12/08/21 | Keysight Technologies
Innovative Passive | 690 kB | 1 | Agilent | Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA 5991-0332 |
|
| 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12].pdf | 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12].pdf | 04/12/21 | Keysight Technologies
Pulsed-IV Parametr | 645 kB | 1 | Agilent | 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12] |
| Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note 599 | Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note 599 | 23/08/21 | Keysight Technologies
Solutions for Achi | 567 kB | 4 | Agilent | Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note 599 |
| 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 19/08/21 | Keysight Technologies
Measuring Dielectr | 525 kB | 2 | Agilent | 5991-2171EN Measuring Dielectric Properties using Keysight 2527s Materials Measurement Solutions - B |
| 6190-3,2.pdf | 6190-3,2.pdf | 21/11/21 | A G R E A T E R M E A S U R | 982 kB | 1 | Keithley | 6190-3,2 |
| 5990-6035EN N6141A & W6141A EMI X-Series Measurement Application - Technical Overview c20140902 [11] | 5990-6035EN N6141A & W6141A EMI X-Series Measurement Application - Technical Overview c20140902 [11] | 17/06/21 | Keysight Technologies
N6141A & W6141A EM | 997 kB | 1 | Agilent | 5990-6035EN N6141A & W6141A EMI X-Series Measurement Application - Technical Overview c20140902 [11] |
| 5990-5729EN Phase Noise Measurement Solutions - Selection Guide c20140918 [24].pdf | 5990-5729EN Phase Noise Measurement Solutions - Selection Guide c20140918 [24].pdf | 30/08/20 | Keysight Technologies
Phase Noise Measur | 4225 kB | 3 | Agilent | 5990-5729EN Phase Noise Measurement Solutions - Selection Guide c20140918 [24] |